Hung Chang Chien

STAr Technologies, Inc. engages in manufacturing and distributing semiconductor reliability testing systems and probe cards. Its semiconductor testing systems include parametric test, reliability test, functional test, yield enhancement, and metrology tool. Its probe cards products include parmetric probe cards, functional probe cards, vertical probe cards, and probe system. The company was founded by Choon Leong Lou and Yu Ming Chien on August 29, 2000 and is headquartered in Hsinchu, Taiwan.

STAr Technologies, Inc. engages in manufacturing and distributing semiconductor reliability testing systems and probe cards. Its semiconductor testing systems include parametric test, reliability test, functional test, yield enhancement, and metrology tool. Its probe cards products include parmetric probe cards, functional probe cards, vertical probe cards, and probe system. The company was founded by Choon Leong Lou and Yu Ming Chien on August 29, 2000 and is headquartered in Hsinchu, Taiwan.

STAr Technologies, Inc. engages in manufacturing and distributing semiconductor reliability testing systems and probe cards. Its semiconductor testing systems include parametric test, reliability test, functional test, yield enhancement, and metrology tool. Its probe cards products include parmetric probe cards, functional probe cards, vertical probe cards, and probe system. The company was founded by Choon Leong Lou and Yu Ming Chien on August 29, 2000 and is headquartered in Hsinchu, Taiwan.

STAr Technologies, Inc. engages in manufacturing and distributing semiconductor reliability testing systems and probe cards. Its semiconductor testing systems include parametric test, reliability test, functional test, yield enhancement, and metrology tool. Its probe cards products include parmetric probe cards, functional probe cards, vertical probe cards, and probe system. The company was founded by Choon Leong Lou and Yu Ming Chien on August 29, 2000 and is headquartered in Hsinchu, Taiwan.

STAr Technologies, Inc. engages in manufacturing and distributing semiconductor reliability testing systems and probe cards. Its semiconductor testing systems include parametric test, reliability test, functional test, yield enhancement, and metrology tool. Its probe cards products include parmetric probe cards, functional probe cards, vertical probe cards, and probe system. The company was founded by Choon Leong Lou and Yu Ming Chien on August 29, 2000 and is headquartered in Hsinchu, Taiwan.