Steven Danyluk
Corporate Officer/Principal bei Georgia Institute of Technology
Aktive Positionen von Steven Danyluk
Unternehmen | Position | Beginn | Ende |
---|---|---|---|
Georgia Institute of Technology | Corporate Officer/Principal | - | - |
Karriereverlauf von Steven Danyluk
Ehemalige bekannte Positionen von Steven Danyluk
Unternehmen | Position | Beginn | Ende |
---|---|---|---|
TEXAS INSTRUMENTS INCORPORATED | Corporate Officer/Principal | 01.01.1973 | - |
University of Illinois | Corporate Officer/Principal | - | - |
Qcept Technologies, Inc.
Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Direktor/Vorstandsmitglied | 01.01.2002 | - |
Gründer | 01.01.2002 | - |
Ausbildung von Steven Danyluk
University of Delaware | Undergraduate Degree |
Cornell University | Doctorate Degree |
Statistik
International
Vereinigte Staaten | 7 |
Operativ
Corporate Officer/Principal | 3 |
Director/Board Member | 1 |
Founder | 1 |
Sektoral
Consumer Services | 5 |
Electronic Technology | 3 |
Besetzte Positionen
Aktive
Inaktive
Börsennotierte Unternehmen
Private Unternehmen
Unternehmensverbindungen
Börsennotierte Unternehmen | 1 |
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TEXAS INSTRUMENTS INCORPORATED | Electronic Technology |
Private Unternehmen | 1 |
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Qcept Technologies, Inc.
Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Electronic Technology |
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